首页> 外文期刊>Pramana >Photoacoustic spectroscopy of thin ???lms of As2S3, As2Se3 and GeSe2
【24h】

Photoacoustic spectroscopy of thin ???lms of As2S3, As2Se3 and GeSe2

机译:薄膜As2S3,As2Se3和GeSe2的光声光谱

获取原文
           

摘要

Photoacoustic spectroscopy (PAS) is one of the important branches of spectroscopy, which enables one to detect light-induced heat production following the absorption of pulsed radiation by the sample. As2S3, As2Se3 and GeSe2 exhibit a wide variety of photo-induced phenomena that enable them to be used as optical imaging or storage medium and various electronic devices, including electro-optic information storage devices and optical mass memories. Therefore, accurate measurement of thermal properties of semiconducting ???lms is necessary to study the memory density. The thermal conductivity of thin ???lms of As2S3 (thickness 100 e???m and 80 e???m), As2Se3 (thickness 100 e???m and 80 e???m) and GeSe2 (thickness 120 e???m and 100 e???m) has been measured using PAS technique. Our result shows that the thermal conductivity of thicker ???lms is larger than the thinner ???lms. This can be explained by the thermal resistance effect between the ???lm and the surface of the substrate.
机译:光声光谱学(PAS)是光谱学的重要分支之一,它使人们能够检测样品吸收脉冲辐射后产生的光诱导的热量。 As2S3,As2Se3和GeSe2表现出各种各样的光致现象,使其可以用作光学成像或存储介质以及包括电光信息存储设备和光学大容量存储器在内的各种电子设备。因此,必须精确地测量半导体lms的热性能以研究存储密度。薄的As2S3薄膜的热导率(厚度为100 e?m和80 e?m),As2Se3(厚度为100 e?m和80 e?m)和GeSe2(厚度为120)使用PAS技术已经测量了e(m e和m 100)。我们的结果表明,较厚的薄膜的热导率大于较薄的薄膜的热导率。这可以通过1m与基片表面之间的热阻效应来解释。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号