Electrical Properties of Pristine and Electron Irradiated Carbon Nanotube Yarns at Small Length Scales

摘要

In this report the effect of e-beam irradiation on Carbon Nanotube (CNT) yarns electrical resistivity was studied by employing electron beam irradiation on a Transmission Electron Microscope (TEM) follow by two probe resistivity method in a Scanning Electron Microscope (SEM). Both local crosslinking and amorphous regions within the CNT yarn were observed with increased electron dosage, as revealed by High Resolution TEM (HRTEM). The resistivity lower bound value was obtained at the maximum dosage used, which was below the resistivity of the pristine yarn. The resistivity data is explained by a proposed model that takes into account the microstructural changes.