FAULT TOLERANT NANO-MEMORY WITH FAULT SECURE ENCODER AND DECODER

摘要

Traditionally, memory cells were the only circuitry susceptible to transient faults The supporting circuitries around the memory were assumed to be fault-free. Due to the increase in soft error rate in logic circuits, the encoder and decoder circuitry around the memory blocks have become susceptible to soft errors as well and must be protected. Memory cells have been protected from soft errors for more than a decade; due to the increase in soft error rate in logic circuits, the encoder and decoder circuitry around the memory blocks have become susceptible to soft errors as well and must also be protected. In this paper a new approach to design fault-secure encoder and decoder circuitry for memory designs. The key novel contribution of this paper is identifying and defining a new class of error-correcting codes whose redundancy makes the design of faultsecure detectors (FSD) particularly simple. We further quantify the importance of protecting encoder and decoder circuitry against transient errors, illustrating a scenario where the system failure rate (FIT) is dominated by the failure rate of the encoder and decoder. We prove that Euclidean Geometry Low-Density Parity-Check (EG-LDPC) codes have the faultsecure detector capability.