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Experimental investigations on the nanomechanical properties of sputter deposited Ni-Mn-Ga ferromagnetic shape memory thin films

机译:溅射沉积Ni-Mn-Ga铁磁形状记忆薄膜的纳米力学性能的实验研究

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NiMnGa thin films were dc magnetron sputter deposited onto well cleaned substrates of Si(100) and glass in high pure argon environment of vacuum 0.01 mbar at low sputtering power of 36W and their mechanical properties were investigated by nanoindentation technique using calibrated Berkovich indenter. Results reveal that the films posses elasto-plastic nature. The elastic modulus of the films was found to be thickness as well as substrate dependent, whereas, the indentation hardness of the films was found to be thickness dependent but substrate independent. The highest elastic modulus of the films obtained was 151.02 GPa and highest indentation hardness of the films was found to be 5513.3 MPa.
机译:将NiMnGa薄膜在36W的低溅射功率,真空度为0.01 mbar的高纯氩气环境下,用直流磁控溅射法沉积在清洗干净的Si(100)和玻璃基板上,并通过纳米压痕技术使用校准的Berkovich压头对它们的力学性能进行了研究。结果表明该膜具有弹塑性性质。发现膜的弹性模量与厚度以及基底有关,而发现膜的压痕硬度与厚度有关但与基底无关。所得膜的最高弹性模量为151.02GPa,并且膜的最高压痕硬度为5513.3MPa。

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