...
首页> 外文期刊>Advanced Structural and Chemical Imaging >Electron beam induced dehydrogenation of MgH2 studied by VEELS
【24h】

Electron beam induced dehydrogenation of MgH2 studied by VEELS

机译:电子束诱导的MgH2脱氢的VEELS研究

获取原文
           

摘要

Nanosized or nanoconfined hydrides are promising materials for solid-state hydrogen storage. Most of these hydrides, however, degrade fast during the structural characterization utilizing transmission electron microscopy (TEM) upon the irradiation with the imaging electron beam due to radiolysis. We use ball-milled MgH2 as a reference material for in-situ TEM experiments under low-dose conditions to study and quantitatively understand the electron beam-induced dehydrogenation. For this, valence electron energy loss spectroscopy (VEELS) measurements are conducted in a monochromated FEI Titan3 80–300 microscope. From observing the plasmonic absorptions it is found that MgH2 successively converts into Mg upon electron irradiation. The temporal evolution of the spectra is analyzed quantitatively to determine the thickness-dependent, characteristic electron doses for electron energies of both 80 and 300 keV. The measured electron doses can be quantitatively explained by the inelastic scattering of the incident high-energy electrons by the MgH2 plasmon. The obtained insights are also relevant for the TEM characterization of other hydrides.
机译:纳米级或纳米级氢化物是用于固态氢存储的有前途的材料。但是,这些氢化物中的大多数在放射线照射下通过成像电子束照射后,在利用透射电子显微镜(TEM)进行结构表征期间会迅速降解。我们以球磨MgH 2 为参考材料,在低剂量条件下进行原位TEM实验,以研究和定量理解电子束诱导的脱氢作用。为此,在单色FEI Titan 3 80-300显微镜下进行价电子能量损失谱(VEELS)测量。通过观察等离子体吸收,发现MgH 2 在电子辐照下相继转化为Mg。对光谱的时间演变进行定量分析,以确定80 keV和300 keV的电子能量的厚度依赖性特征电子剂量。 MgH 2 等离子体激元对入射高能电子的非弹性散射可以定量地解释所测得的电子剂量。获得的见解也与其他氢化物的TEM表征有关。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号