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Influence of silicon on local structure and morphology of γ-FeOOH and α-FeOOH particles

机译:硅对γ-FeOOH和α-FeO​​OH颗粒局部结构和形貌的影响

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The extended X-ray absorption fine structure (EXAFS) method was used for investigating the local structures of lepidocrocite and goethite with and without silicon. The structure and morphology of these particles were investigated using X-ray diffraction and transmission electron microscopy, respectively. The bonding structure was examined by Fourier transform infrared spec-troscopy (FT-IR). When silicon species was added, the structure and morphology changed while the linkage of FeO_6 octahedral units was distorted. The FT-IR spectra revealed the formation of the Fe-O-Si bond in particles containing silicate ions, and the characteristic bond affects the local structure and morphology of the particles.
机译:扩展的X射线吸收精细结构(EXAFS)方法用于研究含硅和不含硅的纤铁矿和针铁矿的局部结构。使用X射线衍射和透射电子显微镜分别研究了这些颗粒的结构和形态。通过傅立叶变换红外光谱法(FT-IR)检查键合结构。当添加硅物种时,FeO_6八面体单元的键变形而结构和形态发生变化。 FT-IR光谱揭示了在含硅酸盐离子的颗粒中Fe-O-Si键的形成,特征键影响颗粒的局部结构和形态。

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