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首页> 外文期刊>Corrosion science >Reduction of hexavalent chromium embedded in organic insulation and corrosion inhibition layers during X-ray photoelectron spectroscopy (XPS) measurements
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Reduction of hexavalent chromium embedded in organic insulation and corrosion inhibition layers during X-ray photoelectron spectroscopy (XPS) measurements

机译:在X射线光电子能谱(XPS)测量过程中减少嵌入有机绝缘层和腐蚀抑制层中的六价铬

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摘要

Chromium compounds are still used in the context of corrosion protection in industrial products, with Cr containing organic coatings on electrical steel as an example. In order to analyse the content of hazardous Cr(VI) components, X-ray photoelectron spectroscopy (XPS) is often promoted as a non-destructive technique which enables the determination of elemental concentrations and chemical states. However, this technique can affect the oxidation state as we show for CaCrO4. The key point is that pure Cr reference materials behave differently as compared to mixed material systems, which has to be considered for a reliable quantification of Cr(VI) by XPS.
机译:铬化合物仍用于工业产品的腐蚀防护,以电工钢上含Cr的有机涂层为例。为了分析有害的Cr(VI)组分的含量,X射线光电子能谱(XPS)通常作为一种非破坏性技术而得到推广,该技术能够确定元素浓度和化学状态。但是,如我们对CaCrO4所示,该技术会影响氧化态。关键是纯铬参考材料的性能与混合材料系统相比有所不同,必须考虑使用XPS对Cr(VI)进行可靠的定量。

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