Testable embedded system firmware development: the out-in methodology

摘要

Reliability is of paramount importance to just about any embedded system firmware. This paper presents the out-in methodology (OIM), a new reliability-driven approach to developing such a system, which is intended to detect static and, more importantly, dynamic errors much faster than the usual firmware development methods. In this approach, the core functionality is developed together with an interface software that is used specifically for testing the core functionality. This paper describes the use of this approach in a real life situation and discusses the benefits, potential pitfalls, and other possible application areas.