High-speed ADC systems with HBTs for measuring instrument applications

摘要

This paper presents very high-speed Analog-to-Digital Converter (ADC) systems for measuring instrument applications, jand also related theoretical results. First we describe the design, testing and performance of ≈ 1 GS/s 6-bit and 6-bit ADCs using SiGe heterojunction bipolar transistor (SiGe HBT), and a 3 GS/s 6-bit ADC and Track/Hold(T/H) circuit using GaAs heterojunction bipolar transistor (GaAs HBT). We show that SiGe HBTs and Ga As HBTs have technological Potential, and that the folding/interpolation architecture is suitable for high-speed ADC systems. Next, we derive three Theoretical results aimed at very high-speed, wideband ADC systems.