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Nondestructive testing of bonding defects in multilayered ceramic matrix composites using THz time domain spectroscopy and imaging

机译:使用THz时域光谱和成像多层陶瓷基复合材料中粘合缺陷的无损检测

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摘要

The accurate detection and imaging of small debonded regions in a 3-layer ceramic matrix composite (CMC) with two bonded layers is a challenge within terahertz (THz) nondestructive detection. To solve this problem, an improved imaging method for detecting bonding defects is proposed based on the statistical characteristics of variance and kurtosis to detect defects in the upper/lower adhesive layers in a multilayered CMC. The proposed method can ultimately realize a detection accuracy of 50 and 250 mu m for bonding defects in the upper and lower adhesive layers, respectively, and achieve a better imaging result compared with power imaging method. Moreover, there is a corresponding relationship between the statistical characteristic value and the bonding defect size-the larger the statistical characteristic value, the larger the bonding defect size-which can be used as a reference to quantify the defect size.
机译:具有两个粘合层的3层陶瓷基质复合物(CMC)中的小剥离区域的精确检测和成像是Terahertz(THz)非破坏性检测内的挑战。为了解决这个问题,基于方差和峰值的统计特征提出了一种改进的用于检测粘合缺陷的成像方法,以检测多层CMC中的上/下粘合剂层中的缺陷。该方法最终可以分别实现50和250μm的检测精度,用于分别粘合上粘合层中的缺陷,并与功率成像方法相比实现更好的成像结果。此外,统计特征值与键合缺陷尺寸之间存在相应的关系 - 统计特征值越大,粘接缺陷尺寸越大 - 可以用作量化缺陷尺寸的参考。

著录项

  • 来源
    《Composite Structures》 |2020年第11期|112624.1-112624.11|共11页
  • 作者单位

    Changchun Univ Sci & Technol Key Lab Optoelect Measurement & Opt Informat Tran Minist Educ Sch Optoelect Engn Changchun 130000 Peoples R China;

    Changchun Univ Sci & Technol Key Lab Optoelect Measurement & Opt Informat Tran Minist Educ Sch Optoelect Engn Changchun 130000 Peoples R China;

    Changchun Univ Sci & Technol Key Lab Optoelect Measurement & Opt Informat Tran Minist Educ Sch Optoelect Engn Changchun 130000 Peoples R China;

    Changchun Univ Sci & Technol Key Lab Optoelect Measurement & Opt Informat Tran Minist Educ Sch Optoelect Engn Changchun 130000 Peoples R China;

    Changchun Univ Sci & Technol Key Lab Optoelect Measurement & Opt Informat Tran Minist Educ Sch Optoelect Engn Changchun 130000 Peoples R China;

    Changchun Univ Sci & Technol Key Lab Optoelect Measurement & Opt Informat Tran Minist Educ Sch Optoelect Engn Changchun 130000 Peoples R China;

    Changchun Univ Sci & Technol Key Lab Optoelect Measurement & Opt Informat Tran Minist Educ Sch Optoelect Engn Changchun 130000 Peoples R China;

    Changchun Univ Sci & Technol Key Lab Optoelect Measurement & Opt Informat Tran Minist Educ Sch Optoelect Engn Changchun 130000 Peoples R China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Bonded multilayer CMC structure; THz time domain spectroscopy (TDS); Characteristic value of bonding defect; Nondestructive testing; Visualization;

    机译:None;

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