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A Mixed Approach for Solving Volume-Surface Integral Equations in the Analysis of Microstrip Antenna and Packaging Structures

机译:微带天线和封装结构分析中体积-表面积分方程的混合求解方法

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Electromagnetic analysis for microstrip antenna and packaging structures is formulated by volume-surface integral equations (VSIEs). The conducting microstrip and ground are described with SIEs, while the dielectric substrate is governed by volume integral equations (VIEs), and they are coupled to each other to form VSIEs. Using VIEs instead of SIEs for dielectric substrate can improve the conditioning of system matrix related to the multiscale property of antenna and packaging structures. The VSIEs are usually solved by the method of moments (MoM) with well-designed basis functions defined over conforming meshes, resulting in much inconvenience of implementation. We propose a mixed approach to solve the VSIEs by combining the traditional MoM for the conducting part and a point-matching scheme for the dielectric part together. The approach uses cuboids to discretize the dielectric substrate and does not require conforming meshes between the conducting and dielectric parts. Also, the approach considers the thickness of metallic microstrip and ground, which is usually neglected. Typical numerical examples are presented to demonstrate the proposed approach, and its effectiveness has been verified.
机译:微带天线和封装结构的电磁分析由体积-表面积分方程(VSIE)表示。导电微带线和地线用SIE描述,而介电基板则由体积积分方程(VIE)控制,它们相互耦合形成VSIE。对于介电衬底,使用VIE代替SIE可以改善与天线和封装结构的多尺度特性有关的系统矩阵的条件。 VSIE通常通过矩量法(MoM)来解决,该矩量法具有在合格网格上定义的设计良好的基函数,从而给实现带来了很多不便。我们提出了一种混合方法来解决VSIE,方法是将导电部分的传统MoM和电介质部分的点匹配方案结合在一起。该方法使用长方体来离散介电基板,并且不需要在导电和介电部分之间形成一致的网格。而且,该方法考虑了通常忽略不计的金属微带和地面的厚度。给出了典型的数值例子来说明该方法,并验证了其有效性。

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