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Testing Serial Correlation in Semiparametric Varying-Coefficient Partially Linear Models

机译:在半曝光变形系数部分线性模型中测试串行相关性

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摘要

We propose two test statistics for testing serial correlation in semiparametric varying-coefficient partially linear models. The proposed test statistics are not only for testing zero first-order serial correlation, but also for testing higher-order serial correlations. Under the null hypothesis of no serial correlation, the test statistics are shown to have asymptotic normal or chi-square distributions. By using R, some Monte Carlo experiments are conducted to examine the finite sample performances of the proposed tests. Simulation results show that the estimated size and power of the proposed tests behave well.
机译:我们提出了两种测试统计,用于测试半射性变化系数部分线性模型中的串行相关性。所提出的测试统计信息不仅用于测试零一阶序列相关性,而且用于测试高阶串行相关性。在无序列相关的零假设下,测试统计显示呈渐近正常或奇方分布。通过使用R,进行一些蒙特卡罗实验以检查所提出的测试的有限样本性能。仿真结果表明,建议试验的估计尺寸和功率表现良好。

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