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A Flash ADC Tolerant to High Offset Voltage Comparators

机译:耐高失调电压比较器的Flash ADC

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摘要

A conventional flash analog-to-digital converter (ADC) with a Wallace tree encoder ensures monotonicity and avoids missing codes, but still requires comparators with low offset voltage, which implies high area and power consumption. In this paper, we extend the purpose of this flash implementation, to allow the comparators to have extremely high offset voltages. This leads to a new approach toward the design of a flash ADC that does not require any type of calibration, allow easy porting among technologies and benefits from scaling. A statistical study is presented to demonstrate the effectiveness of the new method, and a modification is proposed to ensure full-range operation. It is shown that a proposed N-bit ADC has a performance equivalent to an -bit conventional flash ADC, with considerable gains in area and power consumption, with less design effort. The design flow of the OST ADC, with the necessary steps, is presented. A circuit, employing minimum dimension transistors, was fabricated in 0.13- CMOS and used as a proof of concept for the ADCs proposed here.
机译:具有华莱士树编码器的常规闪存模数转换器(ADC)可确保单调性并避免丢失代码,但仍需要比较器具有低失调电压,这意味着较大的面积和功耗。在本文中,我们扩展了这种闪存实现的目的,以允许比较器具有极高的失调电压。这为闪存ADC设计提供了一种新方法,该方法不需要任何类型的校准,可以轻松移植各种技术,并从缩放中受益。进行了一项统计研究,以证明该新方法的有效性,并提出了一种修改方案以确保全范围操作。结果表明,提出的N位ADC的性能与传统的Flash ADC相当,具有面积和功耗的显着提高,且设计工作量较小。介绍了OST ADC的设计流程以及必要的步骤。采用最小尺寸晶体管的电路是在0.13-CMOS中制成的,并用作此处提出的ADC概念验证。

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