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Bit-Percolation Studies on CoPtCr-SiO_2 Perpendicular Magnetic-Recording Media

机译:CoPtCr-SiO_2垂直磁记录介质的位渗透研究

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摘要

The CoPtCr-SiO_2 medium shows great potential for high-density perpendicular magnetic recording, as it displays excellent signal-to-noise ratio (SNR) characteristics together with high thermal stability. However, significant bit percolation, involving a partial combination with the neighboring magnetic bits, has been observed at a high linear recording density, and has been shown to degrade the magnetic-recording patterns. On the other hand, it is known that the magnetic cluster size is a significant factor limiting the linear recording. Therefore, in this paper, we have investigated the relationship between magnetic cluster size and the recording bit length at which bit percolation begins to occur in a CoPtCr-SiO_2 perpendicular magnetic-recording medium to the range of 1500 kfci. According to our experiments using perpendicular recording media with four types of recording layers, which determine the magnetic properties, high-resolution magnetic-force microscopy patterns indicate that the bit length at which percolation begins to occur is almost the same as the magnetic cluster size. These results suggest that the bit length with percolation, which determines the limit of the recording density, can be improved by decreasing the magnetic cluster size of the medium.
机译:CoPtCr-SiO_2介质具有出色的信噪比(SNR)特性以及较高的热稳定性,因此具有高密度垂直磁记录的巨大潜力。然而,已经观察到以高线性记录密度观察到显着的比特渗漏,包括与相邻的磁性比特的部分组合,并且已经显示出其劣化的磁性记录模式。另一方面,已知磁簇的大小是限制线性记录的重要因素。因此,在本文中,我们研究了在1500 kfci范围内的CoPtCr-SiO_2垂直磁记录介质中磁团簇尺寸与记录位长度之间的关系,在位记录开始发生位渗。根据我们的实验,该实验使用具有四种类型的记录层的垂直记录介质来确定磁性,高分辨率的磁力显微镜模式表明,开始发生渗滤的位长几乎与磁簇大小相同。这些结果表明,可以通过减小介质的磁簇尺寸来改善具有渗滤的位长度,其决定了记录密度的极限。

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