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Conductive pattern, electrical and mechanical characterisation of gold nanorods inside porous alumina template

机译:多孔氧化铝模板内金纳米棒的导电图案,电气和力学表征

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Nanowires and nanotubes composed of layered or nonlayered materials have been fabricated via different techniques, among which Anodic Aluminium Oxide (AAO) template-based electrodeposition technology provides a versatile technique for synthesizing one or two-dimensional nanostructured materials. Herein, Conducive Atomic Force Microscopy (CAFM) has been used to image and characterise the nanorods for nanorods with diameter of 50 nm +/- 5. Given that only one previous study using CAFM on gold nanorods exists [1], recording the difficulties encountered with this technique will be of wider interest to the scientific community. This work details experiments on electrical response as a function of applied force on the AFM tip and contamination on the top surface on nanorods. We report a novel observation, revealing a hollow shaped conducive pattern of some of our gold nanorods. This is explained with reference to competing growth rates in horizontal and vertical directions inside the pores.
机译:通过不同的技术制造了由层状或非层形材料构成的纳米线和纳米管,其中阳极氧化铝(AAO)基于基于模板的电沉积技术提供了一种用于合成一种或二维纳米结构材料的通用技术。这里,有利于50nm +-5的纳米棒的纳米棒用于图像并表征用于图像的纳米棒,并且仅在金纳米棒上使用CAFM的一个先前的研究存在[1],记录遇到的困难通过这种技术将对科学界具有更广泛的兴趣。这项工作详细说明了电子响应的实验,作为AFM尖端上施加力的函数和纳米棒上顶表面上的污染。我们报告了一种新颖的观察,揭示了我们一些金纳米棒的空心形的有用模式。参考孔内水平和垂直方向上的竞争增长率来解释这一点。

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