FIB-SIMS analysis of micro-particle impacts on spacecraft materials returned from low-earth orbit

摘要

Returned materials from spacecraft that have had a long exposure in low earth orbit have been examined for remnant projectile residues by liquid metal ion source (LMIS) sputtering and SIMS. It has been possible to distinguish between residue material and the underlying substrate in impact sites as well as the origin of the residue, man-made or extraterrestrial. This approach has also allowed examination of the sub-micrometer internal structures of residue remnants.