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Comparative studies of p6m siliceous mesostructures by powder X-ray diffraction and nitrogen adsorption

机译:粉末X射线衍射和氮吸附对p6m硅质细观结构的比较研究

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Two-dimensional mesostructures with p6m symmetry such as MCM-41 and SBA-15 are the subject of intensive studies by using nitrogen and argon adsorption, transmission electron microscopy, and powder X-ray diffraction/scattering techniques. The latter may involve the X-ray diffraction (XRD) or small angle X-ray scattering (SAXS) measurements. The XRD/SAXS patterns for the aforementioned ordered mesostructures often exhibit four or more reflections, the most intensive one, 100 peak, and three less intensive peaks, 110, 200, 210. So far, analysis of these patterns was usually limited for the evaluation of the unit cell parameter and the identification of the observed peaks. In this work we present an attempt to analyze the XRD/SAXS patterns by including not only the position of observed peaks but also their intensity. It is shown that the intensity of these peaks, especially 110 peak, depends on the ratio of the pore diameter to the unit cell parameter. In particular, this dependence was studied for the intensity ratio of 110 and 200 peaks assuming 200 peak as a reference reflection because of its nearness to 110 peak (which minimizes the influence of other factors than the structural ones on the 110/200 intensity ratio analysis) and similar intensity to that of 110 peak. The values of the 110/200 intensity ratio were determined for many MCM-41 and SBA-15 samples and analyzed in relation to the pore width/ unit cell ratio, where the pore width was estimated on the basis of nitrogen adsorption data or by the XRD/SAXS structure modeling. Comparative analysis of this intensity ratio for numerous MCM-41 and SBA-15 samples allows for a quick estimation of the pore width and provides some information about hexagonality of mesopores in these materials.
机译:具有p6m对称性的二维介观结构,例如MCM-41和SBA-15,是通过使用氮和氩吸附,透射电子显微镜和粉末X射线衍射/散射技术而进行深入研究的主题。后者可能涉及X射线衍射(XRD)或小角度X射线散射(SAXS)测量。前面提到的有序介观结构的XRD / SAXS模式通常表现出四个或更多反射,其中最密集的一个是100个峰值,三个强度较小的一个峰值是110、200、210。晶胞参数的确定和观察峰的识别。在这项工作中,我们尝试通过不仅包括观察到的峰的位置而且还包括它们的强度来分析XRD / SAXS模式。结果表明,这些峰的强度,尤其是110个峰,取决于孔径与晶胞参数的比值。特别是,对于110和200个峰的强度比,研究了这种依赖性,因为200个峰作为参考反射,因为它接近110个峰(这将结构性因素之外的其他因素对110/200强度比分析的影响降至最低),强度与110峰值相似。确定了许多MCM-41和SBA-15样品的110/200强度比值,并根据孔宽/晶胞比进行了分析,其中孔宽是根据氮吸附数据或通过XRD / SAXS结构建模。对许多MCM-41和SBA-15样品的强度比进行比较分析,可以快速估算孔的宽度,并提供有关这些材料中孔的六边形的一些信息。

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