Characterization of diamond-like carbon films by SEM, XRD and Raman spectroscopy

摘要

Diamond-like carbon films were deposited by electrolysis of a water-ethanol solution on Cu at low voltages (60-100 V) at 2 mm interelectrode separation. The films were characterized by scanning electron microscopy (SEM), X-ray diffractometer (XRD) and Raman spectroscopy. The films were found to be continuous and compact with uniform grain distribution. Raman spectroscopy analysis revealed two broad bands at ～1350 and ～1580 cm~(-1). The downshift of the G band of graphite is indicative of the presence of DLC. For XRD analysis, the three strong peaks located at 28 values of 43.2°, 74.06° and 89.9° can be identified with reflections form (111), (2 2 0) and (311) plane of diamond.