Sensitivity of Rs-measurement of HTS thin films by threeprime resonant techniques: cavity resonator, dielectric resonator, andmicrostrip resonator

摘要

The microwave surface resistance, Rs measurement of YBa 2Cu307 -δ (YBCO) thin film deposited on 10 mm × 10 mm LaAlO3 substrate using three prime resonating techniques, namely, cavity end plate substitution technique (20 GHz), dielectric resonator technique (18 GHz), and microstrip resonator technique (5 GHz), is reported. In addition, theoretical analysis for each technique has been performed to calculate the relative percentage error in the measured Rs -value of the YBCO thin film as a function of temperature. It has been found that the shielded dielectric resonator provides far better sensitivity for R.-measurement of the YBCO thin film with minimum relative percentage error (<4%) in the temperature range from 20 K to transition temperature of YBCO thin film compared to the other two techniques