机译:退火温度,残余O_2分压和环境流速对SiO_x纳米线生长的影响
Department of Electronic Materials Engineering, Research School of Physics and Engineering, The Australian National University, Canberra ACT 0200, Australia,School of Chemical Engineering, Nanjing University of Science and Technology, Nanjing 210094, China;
Department of Electronic Materials Engineering, Research School of Physics and Engineering, The Australian National University, Canberra ACT 0200, Australia;
Department of Electronic Materials Engineering, Research School of Physics and Engineering, The Australian National University, Canberra ACT 0200, Australia;
Department of Electronic Materials Engineering, Research School of Physics and Engineering, The Australian National University, Canberra ACT 0200, Australia;
机译:通过大气压化学气相沉积法沉积的SiO_x薄膜的特性与HMDS / O_2流量的关系
机译:O_2分压和衬底温度对等离子体发射光谱和ZnO生长行为的影响
机译:通过离子束溅射沉积在SiO_x生长过程中Si的氧化:原位X射线光电子能谱与氧分压和沉积温度的关系
机译:通过退火Si / SiO_2纳米线的无金属生长通过退火SiO_x(X 2)薄膜沉积PECVD
机译:射频等离子体辅助分子外延生长氮化镓:通过RHEED-TRAXS测定表面化学计量,氮化镓:铍退火以及活性氮种类,表面极性和过量的镓超压对高温极限的影响。
机译:通过低温快速热退火工艺控制生长高均匀性的硒化铟(In2Se3)纳米线
机译:退火温度对GaAs纳米线生长中金催化剂和衬底表面的影响
机译:不同氧气流速和环境温度对在海拔高度工作的压力适合对象的生理影响