Leakage current behavior in lead-free ferroelectric „K,Na…NbO3-LiTaO3-LiSbO3 thin films

摘要

Conduction mechanisms in epitaxial u0002001u0003-oriented pure and 1 mol % Mn-dopednu0002K0.44 ,Na0.52 ,Li0.04u0003u0002Nb0.84 ,Ta0.1 ,Sb0.06u0003O3 u0002KNN-LT-LSu0003 thin films on SrTiO3 substrate wereninvestigated. Temperature dependence of leakage current density was measured as a function ofnapplied electric field in the range of 200–380 K. It was shown that the different transportnmechanisms dominate in pure and Mn-doped thin films. In pure u0002KNN-LT-LSu0003 thin films,nPoole-Frenkel emission was found to be responsible for the leakage, while Schottky emission wasnthe dominant mechanism in Mn-doped thin films at higher electric fields. This is a remarkable yetnclear indication of effect of 1 mol % Mn on the resistive behavior of such thin films. © 2010nAmerican Institute of Physics. u0004doi:10.1063/1.3531575