首页> 外文期刊>Applied Physics Letters >Sub-kelvin thermometer for on-chip measurements of microwave devices utilizing two-level systems in superconducting microresonators
【24h】

Sub-kelvin thermometer for on-chip measurements of microwave devices utilizing two-level systems in superconducting microresonators

机译:用于在超导微导通器中使用两级系统的微波器件的片上测量的亚开尔文温度计

获取原文
获取原文并翻译 | 示例
           

摘要

We present a superconducting microresonator thermometer based on two-level systems (TLSs), which is drop-in compatible with cryogenic microwave systems. The operational temperature range is 50-1000 mK (which may be extended to 5 mK), and the sensitivity (50-75 μK/ √Hz) is relatively uniform across this range. The miniature footprint that conveniently attaches to the feedline of a cryogenic microwave device facilitates the measurement of on-chip device temperature and requires no additional thermometry wiring or readout electronics. We demonstrate the practical use of these TLS thermometers to investigate static and transient chip heating in a kinetic inductance traveling-wave parametric amplifier operated with a strong pump tone. TLS thermometry may find broad application in cryogenic microwave devices such as superconducting qubits and detectors.
机译:我们基于两级系统(TLSS)的超导微管状温度计,其与低温微波系统兼容。操作温度范围为50-1000 mk(可以扩展到5 mk),并且灵敏度(50-75μk/√Hz)在该范围内相对均匀。方便地连接到低温微波器件的馈电线的微型占地面积有助于测量片上器件温度,不需要额外的温度布线或读出电子器件。我们证明了这些TLS温度计的实际用途,以研究在具有强泵音的动力学行进波参数放大器中的静态和瞬态芯片加热。 TLS温度测量可以在低温微波器件(如超导Qubits和探测器)中找到广泛的应用。

著录项

  • 来源
    《Applied Physics Letters》 |2020年第19期|192601.1-192601.6|共6页
  • 作者单位

    National Institute of Standards and Technology Boulder Colorado 80305 USA;

    National Institute of Standards and Technology Boulder Colorado 80305 USA;

    National Institute of Standards and Technology Boulder Colorado 80305 USA Department of Physics University of Colorado Boulder Colorado 80309 USA;

    National Institute of Standards and Technology Boulder Colorado 80305 USA Department of Physics University of Colorado Boulder Colorado 80309 USA;

    National Institute of Standards and Technology Boulder Colorado 80305 USA Department of Physics University of Colorado Boulder Colorado 80309 USA;

    National Institute of Standards and Technology Boulder Colorado 80305 USA Department of Physics University of Colorado Boulder Colorado 80309 USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号