机译:通过光学不透明层的低占空比光栅光声检测
Advanced Research Centre for Nanolithography (ARCNL) Science Park 106 1098 XC Amsterdam The Netherlands Van der Waals-Zeeman Institute University of Amsterdam Science Park 904 1098 XH Amsterdam The Netherlands;
Advanced Research Centre for Nanolithography (ARCNL) Science Park 106 1098 XC Amsterdam The Netherlands Van der Waals-Zeeman Institute University of Amsterdam Science Park 904 1098 XH Amsterdam The Netherlands;
Advanced Research Centre for Nanolithography (ARCNL) Science Park 106 1098 XC Amsterdam The Netherlands Department of Physics and Astronomy Vrije Universiteit De Boelelaan 1081 1081 HV Amsterdam The Netherlands;
Advanced Research Centre for Nanolithography (ARCNL) Science Park 106 1098 XC Amsterdam The Netherlands Department of Physics and Astronomy Vrije Universiteit De Boelelaan 1081 1081 HV Amsterdam The Netherlands;
Advanced Research Centre for Nanolithography (ARCNL) Science Park 106 1098 XC Amsterdam The Netherlands Van der Waals-Zeeman Institute University of Amsterdam Science Park 904 1098 XH Amsterdam The Netherlands;
机译:作为两层不透明材料的多孔硅的光能隙的光声测量
机译:测量在多层介电叠层顶部制造的光刻胶光栅掩模的占空比
机译:测量在多层介质叠层顶部制造的光刻胶光栅掩模的占空比
机译:DEMO摘要:低功耗,低延迟,高可靠性无线循环多跳WSNS的跨层设计
机译:光学不透明和热薄固体的光声效应的应用:光功率计
机译:使用移动的光栅以百万分之几的水平对气体进行光声痕量检测
机译:通过超快电子动力学光学测量通过不透明金属层检测周期性结构
机译:光接收机在可变占空比曼彻斯特编码数据检测中的性能