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Photoacoustic detection of low duty cycle gratings through optically opaque layers

机译:通过光学不透明层的低占空比光栅光声检测

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摘要

We report on the use of ultra-high frequency photoacoustics to detect gratings with linewidths as narrow as 75 nm, buried underneath optically opaque metal layers. Our results show that buried gratings can be detected by observing diffraction from the spatially periodic acoustic replica of the buried grating at the glass/metal interface and from replicas of the acoustic wave inside the glass substrate. The measured diffraction signals show a linear dependence on grating duty cycle rather than the expected quadratic one. We find that this is due to the presence of a coherent background optical field, which interferes with and coherently amplifies the weaker fields diffracted off the grating-shaped acoustic waves. Our measurements show that ultra-high frequency photoacoustics is a promising technique for detection of sub-wavelength periodic nanostructures.
机译:我们报告使用超高频光声测量方法以检测具有较窄为75nm的线宽的光栅,埋在光学不透明的金属层下方。我们的结果表明,可以通过在玻璃/金属界面处的掩埋光栅的空间周期声学复制品以及玻璃基板内的声波的复制品中观察来自空间周期性声学复制品的衍射来检测掩埋光栅。测量的衍射信号显示对光栅占空比而不是预期的二次乘积的线性依赖性。我们发现这是由于存在相干背景光场,这使得干扰并相干地放大衍射从光栅形声波衍射的较弱场。我们的测量表明,超高频光声学是用于检测子波长周期纳米结构的有希望的技术。

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  • 来源
    《Applied Physics Letters》 |2020年第5期|051104.1-051104.5|共5页
  • 作者单位

    Advanced Research Centre for Nanolithography (ARCNL) Science Park 106 1098 XC Amsterdam The Netherlands Van der Waals-Zeeman Institute University of Amsterdam Science Park 904 1098 XH Amsterdam The Netherlands;

    Advanced Research Centre for Nanolithography (ARCNL) Science Park 106 1098 XC Amsterdam The Netherlands Van der Waals-Zeeman Institute University of Amsterdam Science Park 904 1098 XH Amsterdam The Netherlands;

    Advanced Research Centre for Nanolithography (ARCNL) Science Park 106 1098 XC Amsterdam The Netherlands Department of Physics and Astronomy Vrije Universiteit De Boelelaan 1081 1081 HV Amsterdam The Netherlands;

    Advanced Research Centre for Nanolithography (ARCNL) Science Park 106 1098 XC Amsterdam The Netherlands Department of Physics and Astronomy Vrije Universiteit De Boelelaan 1081 1081 HV Amsterdam The Netherlands;

    Advanced Research Centre for Nanolithography (ARCNL) Science Park 106 1098 XC Amsterdam The Netherlands Van der Waals-Zeeman Institute University of Amsterdam Science Park 904 1098 XH Amsterdam The Netherlands;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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