...
首页> 外文期刊>Applied Physics Letters >Reducing frequency drift caused by light shift in coherent population trapping-based low-power atomic clocks
【24h】

Reducing frequency drift caused by light shift in coherent population trapping-based low-power atomic clocks

机译:减少基于相干人口陷阱的低功耗原子钟中光移引起的频率漂移

获取原文
获取原文并翻译 | 示例
           

摘要

We propose a model to reduce the influence that the light-shift induced frequency drift has on the long-term stability of coherent population trapping (CPT)-based low-power atomic clocks. We experimentally validated the proposed model using the chip-scale atomic clock architecture. The model considers both the drift of the dc-bias current to compensate for the wavelength aging of the vertical-cavity surface-emitting laser (VCSEL) and the variation in the modulation index of the light field generated by the VCSEL. We investigated the dc-bias-current-dependency of the frequency drift in an atomic clock module both theoretically and experimentally, confirming that the frequency drift can change as a function of the VCSEL basic parameters. When the atomic clock module was operated over a period of five months at the dc-bias current affording a zero-crossing of the clock frequency drift, the Allan standard deviation and clock frequency drift for long-term stability were 8.0 × 10~(-12) for averaging times of 4 × 10~6 s and 2.4 × 10~(-13)/day, respectively. Our approach is promising to improve the long-term stability of CPT-based low-power atomic clocks.
机译:我们提出一种模型,以减少光移引起的频率漂移对基于相干粒子阱(CPT)的低功率原子钟的长期稳定性的影响。我们使用芯片级原子时钟架构通过实验验证了所提出的模型。该模型既考虑了直流偏置电流的漂移以补偿垂直腔面发射激光器(VCSEL)的波长老化,又考虑了VCSEL产生的光场的调制指数的变化。我们在理论上和实验上都研究了原子钟模块中频率漂移的dc-bias-current-dependency,从而确认了频率漂移会随VCSEL基本参数的变化而变化。当原子钟模块在直流偏置电流下工作五个月,时钟频率漂移为零时,长期稳定性的艾伦标准偏差和时钟频率漂移为8.0×10〜(- 12)的平均时间分别为4×10〜6 s和2.4×10〜(-13)/天。我们的方法有望改善基于CPT的低功耗原子钟的长期稳定性。

著录项

  • 来源
    《Applied Physics Letters》 |2020年第10期|104102.1-104102.5|共5页
  • 作者单位

    National Institute of Advanced Industrial Science and Technology (AIST) 1-1-1 Umezono Tsukuba Ibaraki 305-8563 Japan;

    Ricoh Company LTD. 5-10 Yokarakami Kumanodo Takadate Natori Miyagi 981-1241 Japan;

    Craduate School of System Design Tokyo Metropolitan University Hachioji Tokyo 192-0397 Japan;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号