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Demonstration of a 256X256 middle-wavelength infrared focal plane array based on InGaAs/InGaP quantum dot infrared photodetectors

机译:基于InGaAs / InGaP量子点红外光电探测器的256X256中波长红外焦平面阵列的演示

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We report a demonstration of an infrared focal plane array based on InGaAs/InGaP quantum dot infrared photodetectors. The middle-wavelength infrared quantum-dot infrared photodetector (QDIP) structure was grown via low-pressure metal organic chemical vapor deposition. A detectivity of 3.6 x 10~(10) cmHz~(1/2)/W was achieved at T=95 K and a bias of -1.4 V. The background limited temperature of our QDIP was 140 K with a 45° field of view. A 256 x 256 detector array was fabricated with dry etching, and hybridized to a Litton readout chip by indium bumps. Thermal imaging was achieved at temperatures up to 120 K. At T = 77 K, the noise equivalent temperature difference was measured as 0.509 K with a 300 K background and f/2.3 optics.
机译:我们报告了基于InGaAs / InGaP量子点红外光电探测器的红外焦平面阵列的演示。通过低压金属有机化学气相沉积法生长了中波长红外量子点红外光电探测器(QDIP)结构。在T = 95 K且偏置为-1.4 V时实现了3.6 x 10〜(10)cmHz〜(1/2)/ W的检测率。我们的QDIP的背景极限温度为140 K,电场为45°视图。通过干法蚀刻制造了256 x 256的探测器阵列,并通过铟凸点与Litton读出芯片杂交。在高达120 K的温度下实现了热成像。在T = 77 K的情况下,使用300 K背景和f / 2.3光学元件测得的噪声等效温度差为0.509K。

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