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Formation of ultrahigh-density InAs/AlAs quantum dots by metalorganic chemical vapor deposition

机译:金属有机化学气相沉积法形成超高密度InAs / AlAs量子点

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摘要

High-density InAs quantum dots (QDs) were grown on an AlAs matrix layer by metalorganic chemical vapor deposition. The effects of various growth parameters were systematically studied by atomic force microscopy. The AlAs layer was essential for obtaining high-density QDs, with densities as high as 4.7×10~(11) cm~(-2). We have also demonstrated the effects of a thin GaAs insertion layer to prevent aluminum intermixing and to block some defects, which occurred on the GaAs buffer layer. As a result, the photoluminescence intensity of InAs/GaAs/AlAs QD structures was improved by two orders of magnitude.
机译:通过金属有机化学气相沉积法,在AlAs基体层上生长了高密度InAs量子点(QD)。通过原子力显微镜系统地研究了各种生长参数的影响。 AlAs层对于获得高密度QD至关重要,其密度高达4.7×10〜(11)cm〜(-2)。我们还证明了薄GaAs插入层的作用是防止铝混入并阻止在GaAs缓冲层上发生的某些缺陷。结果,InAs / GaAs / AlAs QD结构的光致发光强度提高了两个数量级。

著录项

  • 来源
    《Applied Physics Letters》 |2004年第11期|p.1877-1879|共3页
  • 作者单位

    Research Center for Advanced Science and Technology, Institute of Industrial Science, University of Tokyo, 4-6-1, Komaba, Meguro-ku, Tokyo, 153-8904, Japan;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 应用物理学;
  • 关键词

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