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Position sensitive x-ray spectrophotometer using microwave kinetic inductance detectors

机译:使用微波动电感检测器的位置敏感X射线分光光度计

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摘要

The surface impedance of a superconductor changes when energy is absorbed and Cooper pairs are broken to produce single electron (quasiparticle) excitations. This change may be sensitively measured using a thin-film resonant circuit called a microwave kinetic inductance detector (MKID). The practical application of MKIDs for photon detection requires a method of efficiently coupling the photon energy to the MKID. The authors present results on position sensitive x-ray detectors made by using two aluminum MKIDs on either side of a tantalum photon absorber strip. Diffusion constants, recombination times, and energy resolution are reported. MKIDs can easily be scaled into large arrays.
机译:超导体的表面阻抗在吸收能量并且库珀对断裂以产生单电子(准粒子)激发时发生变化。可以使用称为微波动电感检测器(MKID)的薄膜谐振电路灵敏地测量此变化。 MKID在光子检测中的实际应用需要一种有效地将光子能量耦合到MKID的方法。作者介绍了通过在钽光子吸收带两侧使用两个铝制MKID制成的位置敏感型X射线探测器的结果。报告了扩散常数,重组时间和能量分辨率。 MKID可以轻松扩展为大型阵列。

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