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Probabilistic analysis of tetrahedral carbon hybridization in amorphous carbon films

机译:非晶碳膜中四面体碳杂化的概率分析

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摘要

An energetic particle collision analysis of the effect of Ar~+ ion bombardment on tetrahedral carbon hybridization (sp~3) in amorphous carbon (a-C) thin films is presented for nonmagnetron radio-frequency sputtering. The analysis is based on sequential surface events involving the collision of Ar~+ ions with carbon atoms on the surface of the growing film and subsequent collision cascades between excited carbon atoms and other surface carbon atoms, which promote the formation of sp~3 carbon bonding. The model is validated by transmission electron and electron energy loss spectroscopy results that confirm the existence of a two-layer film structure consisting of an ultrathin interface layer and a continuous a-C film. Analytical results for the sp~3 carbon content are shown to be in good agreement with similar experimental results obtained from the analysis of the C1s core level spectra of the sputtered a-C films.
机译:针对非磁控射频溅射中Ar〜+离子轰击对非晶碳(a-C)薄膜中四面体碳杂化(sp〜3)的影响,进行了高能粒子碰撞分析。该分析基于连续的表面事件,其中涉及Ar〜+离子与生长膜表面上的碳原子的碰撞以及激发的碳原子与其他表面碳原子之间的随后碰撞级联,从而促进了sp〜3碳键的形成。该模型通过透射电子和电子能量损失光谱结果验证,该结果证实了由超薄界面层和连续a-C膜组成的两层膜结构的存在。结果表明,sp〜3碳含量的分析结果与通过溅射a-C薄膜的C1s核心能级谱分析获得的类似实验结果非常吻合。

著录项

  • 来源
    《Applied Physics Letters》 |2006年第22期|p.221908.1-221908.3|共3页
  • 作者

    D. Wan; K. Komvopoulos;

  • 作者单位

    Department of Mechanical Engineering, University of California, Berkeley, California 94720;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 应用物理学;计量学;
  • 关键词

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