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Low-resistivity, stable p-type ZnO thin films realized using a Li-N dual-acceptor doping method

机译:使用Li-N双受主掺杂方法实现的低电阻率稳定p型ZnO薄膜

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摘要

A Li-N dual-acceptor doping method has been developed to prepare p-type ZnO thin films by pulsed laser deposition. The lowest room-temperature resistivity is found to be ~0.93 Ω cm, much lower than that of Li or N monodoped ZnO films. The p-type conductivity of ZnO:(Li,N) films is very reproducible and stable, with acceptable crystal quality. The acceptor activation energy in ZnO:(Li,N) is about 95 meV. ZnO-based homostructural p-n junctions were fabricated by depositing an n-type ZnO:Al layer on a p-type ZnO:(Li,N) layer, confirmed by secondary ion mass spectroscopy. The current-voltage characteristics exhibit their inherent rectifying behaviors.
机译:已经开发了Li-N双受主掺杂方法以通过脉冲激光沉积制备p型ZnO薄膜。发现最低的室温电阻率为〜0.93Ωcm,远低于Li或N单掺杂ZnO薄膜的电阻率。 ZnO:(Li,N)薄膜的p型电导率可重现且稳定,具有可接受的晶体质量。 ZnO:(Li,N)中的受体活化能约为95 meV。通过二次离子质谱法证实,通过在p型ZnO:(Li,N)层上沉积n型ZnO:Al层来制造基于ZnO的同构p-n结。电流-电压特性表现出其固有的整流特性。

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