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Simultaneous measurements of conductivity and magnetism by using microprobes and electron holography

机译:使用微探针和电子全息图同时测量电导率和磁性

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摘要

This study demonstrates a transmission electron microscopy based system that enables simultaneous measurements of conductivity and magnetism in a nanoscale area. A double-probe piezodriving holder is developed in order to determine the conductivity in any part of a thin-foil specimen. The conductivity measurement can be combined with electron holography, which can be used to obtain a magnetic flux map of the same area. This system can be applied extensively for the research and development of electronic and/or magnetic materials.
机译:这项研究演示了基于透射电子显微镜的系统,该系统能够同时测量纳米级区域的电导率和磁性。开发了一种双探针压电驱动器支架,以确定薄箔样品任何部分的电导率。电导率测量可以与电子全息术结合使用,后者可以用于获得相同面积的磁通图。该系统可广泛用于电子和/或磁性材料的研究和开发。

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