In situ x-ray diffraction study of the thermal expansion of the ordered arrays of silver nanowires embedded in anodic alumina membranes

摘要

Thermal expansion of as-prepared and annealed ordered arrays of silver nanowires embedded in anodic alumina membranes (AAMs) was studied by in situ x-ray diffraction measurement in the temperature range from 25 to 800℃. The axial thermal expansion coefficient (TEC) for the as-prepared nanowires is 6.35 x 10~(-9)/℃ and 6.02 x 10~(-6)/℃ below and above 650℃, respectively. However, the TEC of the annealed sample turns from 2.32 x 10~(-6)/℃ to 12.06 x 10~(-6)/℃ when the temperature is above 350℃. The collective effects of the intrinsic expansion, surface pressure, the limit effect of AAM, and the vacancies incorporated into the silver lattice were responsible for the thermal expansion.