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Direct observation of photoinduced charge redistribution of WO_3-TiO_2 double layer nanocomposite films by photoassisted Kelvin force microscopy

机译:光辅助开尔文力显微镜直接观察WO_3-TiO_2双层纳米复合薄膜的光诱导电荷再分布

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摘要

The microscopic photoinduced charge redistribution between heterogeneous semiconductor nanofilms of WO_3 and TiO_2 double layers (written as WO_3-TiO_2 nanocomposite films) was directly observed using Kelvin probe force microscopy (KFM) coupled with an UV light source. Under illumination the surface potential morphologies of WO_3-TiO_2 nanocomposite films changed from 162 to 592 mV, which was associated with the photoinduced charge transfer between WO_3 and TiO_2 nanoparticles due to the energy level alignment between them. This improved technique of photoassisted KFM was presented to visualize the photoinduced charge transfer between different semiconductor nanoparticles on microscopic scale.
机译:使用开尔文探针力显微镜(KFM)结合紫外光源,直接观察了WO_3和TiO_2双层异质半导体纳米膜(写为WO_3-TiO_2纳米复合膜)之间的微观光诱导电荷再分布。在光照下,WO_3-TiO_2纳米复合薄膜的表面电势形态从162变为592 mV,这与WO_3和TiO_2纳米粒子之间的能级对准导致光诱导的电荷转移有关。提出了这种改进的光辅助KFM技术,以微观规模可视化不同半导体纳米颗粒之间的光诱导电荷转移。

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