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Thickness dependency of 180° stripe domains in ferroelectric ultrathin films: A first-principles-based study

机译:铁电超薄膜中180°条纹区域的厚度依赖性:基于第一性原理的研究

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摘要

A first-principles-based scheme is used to investigate the thickness dependency of domain width of 180° stripe domains in Pb(Zr,Ti)O_3 ultrathin films. Our study shows that (1) more metastable states with energy closer to the 180° stripe domain ground state occur in thicker films, (2) the Kittel law is valid for 180° stripe domains when the film thickness is above 1.6 nm, and (3) below 1.2 nm, the Kittel law cannot be applied anymore due to the disappearance of domains. The thickness dependency of the domain morphology is also discussed.
机译:基于第一原理的方案用于研究Pb(Zr,Ti)O_3超薄膜中180°条纹畴的畴宽的厚度依赖性。我们的研究表明(1)在较厚的薄膜中会出现更多的亚稳态,其能量更接近180°条纹区域的基态;(2)当薄膜厚度超过1.6 nm时,Kittel定律对180°条纹区域有效;并且( 3)在1.2 nm以下,由于域的消失,Kittel法则不再适用。还讨论了畴形态的厚度依赖性。

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