机译:表征自由载流子在完全蚀刻的电介质包覆硅波导中的作用
Department of Electrical and Computer Engineering, University of California, San Diego, 9500 Gilman Dr., La Jolla, California 92023, USA;
Department of Electrical and Computer Engineering, University of California, San Diego, 9500 Gilman Dr., La Jolla, California 92023, USA;
Department of Electrical and Computer Engineering, University of California, San Diego, 9500 Gilman Dr., La Jolla, California 92023, USA;
Department of Electrical and Computer Engineering, University of California, San Diego, 9500 Gilman Dr., La Jolla, California 92023, USA;
Department of Electrical and Computer Engineering, University of California, San Diego, 9500 Gilman Dr., La Jolla, California 92023, USA;
机译:双光子吸收和自由载流子效应对硅波导中全光逻辑门的影响
机译:基于硅波导中四波混合的双光子吸收和自由载流子效应对时间透镜的影响
机译:自由载体对硅 - 绝缘体纳米波导调节不稳定性的影响分析
机译:硅波导交叉相位调制中自由载流子效应的重复率依赖性
机译:硅波导结构中的传播,损耗和自由载流子效应。
机译:由磷和硼掺杂的富硅氧化物和氮氧化物生长的硅纳米晶体中没有自由载流子
机译:表征自由载流子在完全蚀刻中的影响, 介电包层硅波导
机译:非晶硅薄膜中的自由载流子和温度效应。