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Selective chemical vapor sensing with few-layer MoS_2 thin-film transistors: Comparison with graphene devices

机译:几层MoS_2薄膜晶体管的选择性化学蒸气感测:与石墨烯器件的比较

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摘要

We demonstrated selective gas sensing with MoS_2 thin-film transistors using the change in the channel conductance, characteristic transient time, and low-frequency current fluctuations as the sensing parameters. The back-gated MoS_2 thin-film field-effect transistors were fabricated on Si/SiO_2 substrates and intentionally aged for a month to verify reliability and achieve better current stability. The same devices with the channel covered by 10 nm of Al_2O_3 were used as reference samples. The exposure to ethanol, acetonitrile, toluene, chloroform, and methanol vapors results in drastic changes in the source-drain current. The current can increase or decrease by more than two-orders of magnitude depending on the polarity of the analyte. The reference devices with coated channel did not show any response. It was established that transient time of the current change and the normalized spectral density of the low-frequency current fluctuations can be used as additional sensing parameters for selective gas detection with thin-film MoS_2 transistors.
机译:我们展示了使用MoS_2薄膜晶体管进行的选择性气体传感,使用沟道电导,特征瞬态时间和低频电流波动的变化作为传感参数。在Si / SiO_2衬底上制造背栅式MoS_2薄膜场效应晶体管,并有意老化一个月以验证可靠性并获得更好的电流稳定性。通道被10 nm Al_2O_3覆盖的相同器件用作参考样品。暴露于乙醇,乙腈,甲苯,氯仿和甲醇蒸气会导致源极-漏极电流发生剧烈变化。根据分析物的极性,电流可以增加或减少两个数量级以上。具有涂层通道的参考设备未显示任何响应。已经确定,电流变化的瞬态时间和低频电流波动的归一化频谱密度可以用作薄膜MoS_2晶体管选择性气体检测的附加传感参数。

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  • 来源
    《Applied Physics Letters》 |2015年第2期|023115.1-023115.5|共5页
  • 作者单位

    Phonon Optimized Engineered Materials (POEM) Center, Materials Science and Engineering Program, University of California-Riverside, Riverside, California 92521, USA,Nano-Device Laboratory, Department of Electrical Engineering, Bourns College of Engineering, University of California-Riverside, Riverside, California 92521, USA;

    Nano-Device Laboratory, Department of Electrical Engineering, Bourns College of Engineering, University of California-Riverside, Riverside, California 92521, USA;

    Department of Electrical, Computer, and Systems Engineering, Center for Integrated Electronics, Rensselaer Polytechnic Institute, Troy, New York 12180, USA,Ioffe Physical-Technical Institute, St. Petersburg 194021, Russia;

    Department of Electrical, Computer, and Systems Engineering, Center for Integrated Electronics, Rensselaer Polytechnic Institute, Troy, New York 12180, USA;

    Phonon Optimized Engineered Materials (POEM) Center, Materials Science and Engineering Program, University of California-Riverside, Riverside, California 92521, USA,Nano-Device Laboratory, Department of Electrical Engineering, Bourns College of Engineering, University of California-Riverside, Riverside, California 92521, USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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