Amplitude dependence of image quality in atomically-resolved bimodal atomic force microscopy

摘要

In bimodal frequency modulation atomic force microscopy (FM-AFM), two flexural modes are excited simultaneously. We show atomically resolved images of KBr(100) in ambient conditions in both modes that display a strong correlation between the image quality and amplitude. We define the sum amplitude as the sum of the amplitudes of both modes. When the sum amplitude becomes larger than about 100 pm, the signal-to-noise ratio (SNR) drastically decreases. We propose that this is caused by the temporary presence of one or more water layers in the tip-sample gap. These water layers screen the short range interaction and must be displaced with each oscillation cycle. Decreasing the amplitude of either mode, however, increases the noise. Therefore, the highest SNR in ambient conditions is achieved when twice the sum amplitude is slightly less than the thickness of the primary hydration layer.