Compact and cost effective lab-based edge-illumination x-ray phase contrast imaging with a structured focal spot

摘要

We present a different implementation of the Edge Illumination (EI) X-ray Phase Contrast imaging method based on the use of multiple focal spots created through an additional x-ray mask. While this resembles directly inspired by the Talbot-Lau implementation of grating interferometry, the aim of the source mask and its effect on the acquired images are different. The individual "sourcelets" are much larger than in grating methods, and then still spatially incoherent; however, their use allows (a) exploiting cheap and large focal spot sources and (b) reducing the source spot size from the usual 70.100 μm typically used in EI to few tens of μm, which enables the realisation of more compact setups. However, in EI, multiple sources create images shifted by one detector pixel with respect to the other, imposing the use of an image restoration algorithm. Here, we show that the approach is feasible by deconvolving differential phase-contrast image profiles acquired with three separate sources, and comparing results with simulation predictions for equivalent profiles generated by a single source. We also show that this enables reducing the system length from the 2 m used so far to 1 m.