Publisher's Note: 'Effect of interfacial excess oxygen on positive-bias temperature stress instability of self-aligned coplanar InGaZnO thin-film transistors' [Appl. Phys. Lett. 108, 141604 (2016)]

摘要

This article was originally published online on 8 April 2016. Due to a production error, co-author In Byeong Kang's affiliation was listed incorrectly. AIP Publishing apologizes for this error. The affiliation appear correctly above. All online versions of the article were corrected on 11 April 2016, and it appears correctly in print.