机译:基于TaO_x的电阻式开关存储器中超低温度测量的读取电流噪声的微观原因
Institute of Microelectronics, Peking University, Beijing 100871, China;
Institute of Microelectronics, Peking University, Beijing 100871, China;
Institute of Microelectronics, Peking University, Beijing 100871, China;
Institute of Microelectronics, Peking University, Beijing 100871, China;
Institute of Microelectronics, Peking University, Beijing 100871, China;
Institute of Microelectronics, Peking University, Beijing 100871, China;
Institute of Microelectronics, Peking University, Beijing 100871, China;
机译:基于TaO_x的非极性电阻随机存取存储器的切换模型
机译:基于TaO_x的存储设备中极性相关和多级电阻切换相关机制的启示
机译:氧化钨电阻开关存储器中由扰动引起的SET-SET电流衰减的建模
机译:带有CNT电极的电阻式基于AlOx的存储器,用于超低开关电流和高密度存储器应用
机译:基于开关过程的建模控制非易失性铪 - 氧化物电阻开关存储器的变异性
机译:PEDOT PSS中的电阻性切换记忆现象:可切换二极管效应和一次写入多次读取记忆并存
机译:电阻切换:解开多晶SRTIO 3电阻开关记忆中纳丝形成的起源和机制(ADV。Mater。28/2019)