机译:基于小面反射率测量的激光二极管早期灾难性光学损伤监测
Faculty of Information Technology, School of Microelectronics, Beijing University of Technology, Beijing 100124, China;
Faculty of Information Technology, School of Microelectronics, Beijing University of Technology, Beijing 100124, China;
Faculty of Information Technology, School of Microelectronics, Beijing University of Technology, Beijing 100124, China;
Hebei Semiconductor Institute, Shijiazhuang 050051, China;
Hebei Semiconductor Institute, Shijiazhuang 050051, China;
Faculty of Information Technology, School of Microelectronics, Beijing University of Technology, Beijing 100124, China;
Faculty of Information Technology, School of Microelectronics, Beijing University of Technology, Beijing 100124, China;
State Grid Key Laboratory of Power Chip Design and Analysis Technology, Beijing Smart-Chip Microelectronics Technology Company Limited, Beijing 100031, China;
机译:二极管激光器正面和背面的灾难性光学损坏
机译:大功率单横模二极管激光器输出面的灾难性光学退化。 2.计算灾难性光学退化的空间温度分布和阈值
机译:GaN基二极管激光器的灾难性光学损伤:事件序列,损坏模式,以及与基于GAAS的设备的比较
机译:975 nm发射二极管激光器正面和背面的灾难性光学损坏
机译:用于无源对准的混合光学封装的整体式刻蚀面三角形波导二极管环形激光器阵列。
机译:揭露激光二极管化石以及大功率激光二极管中灾难性光学损伤向热生长的动力学分析
机译:在单脉冲操作期间监控二极管激光器中的灾难性光学镜损伤
机译:NH(sub 3)点监测和基于二极管激光的路径综合测量的比较