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Parameter study and design of wide-band widescan dual-polarized tapered slot antenna arrays

机译:宽带宽扫描双极化锥形缝隙天线阵列的参数研究与设计

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摘要

A parameter study of dual-polarized tapered slot antenna (TSA) arrays shows the key features that affect the wide-band and widescan performance of these arrays. The overall performance can be optimized by judiciously choosing a combination of parameters. In particular, it is found that smaller circular slot cavities terminating the bilateral slotline improve the performance near the low end of the operating band, especially when scanning in the H-plane. The opening rate of the tapered slotline mainly determines the mid-band performance and it is possible to choose an opening rate to obtain balanced overall performance in the mid-band. A longer tapered slotline is shown to increase the bandwidth, especially in the lower end of the operating band. Finally, it is shown that the H-plane anomalies are affected by the array element spacing. A design example demonstrates that the results from the parameter study can be used to design a dual-polarized TSA array with about 4.5:1 bandwidth for a scan volume of not less than /spl theta/=45/spl deg/ from broadside in all planes.
机译:对双极化锥形缝隙天线(TSA)阵列进行的参数研究显示了影响这些阵列的宽带和宽扫描性能的关键特征。可以通过明智地选择参数组合来优化整体性能。特别地,发现终止于双侧缝隙线的较小的圆形缝隙腔改善了在工作频带的低端附近的性能,尤其是当在H平面中扫描时。锥形缝隙线的开口率主要决定中频带的性能,可以选择开口率以获得中频带的均衡整体性能。较长的锥形槽线可以增加带宽,特别是在工作频带的下端。最后,表明H平面异常受阵列元素间距的影响。一个设计实例表明,参数研究的结果可用于设计带宽约为4.5:1的双极化TSA阵列,并且从宽面来看,扫描体积不小于/ spl theta / = 45 / spl deg /飞机。

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