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首页> 外文期刊>Advanced Materials >Spatially Mapping Charge Carrier Density and Defects in Organic Electronics Using Modulation-Amplified Reflectance Spectroscopy
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Spatially Mapping Charge Carrier Density and Defects in Organic Electronics Using Modulation-Amplified Reflectance Spectroscopy

机译:使用调制放大反射光谱技术在空间上映射有机电子中的载流子密度和缺陷

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摘要

Semiconducting polymers have enabled the development of a remarkable new class of optoelectronic devices, including flexible solar cells, roll-to-roll electronics, and organic transistors. However, charge transport in conjugated molecules is a complex phenomenon that remains an open scientific question with a range of mechanistic theories, slowing the commercial development of organic optoelectronics. Development of charge-carrier visualization tools for organic semiconductors is essential both for fundamental explorations of carrier transport in organic thin films and for smartly engineering high efficiency organic devices.
机译:半导体聚合物使新型光电器件的发展成为可能,包括柔性太阳能电池,卷对卷电子器件和有机晶体管。然而,共轭分子中的电荷传输是一个复杂的现象,它仍然是一系列力学理论中尚未解决的科学问题,从而减缓了有机光电技术的商业发展。开发有机半导体电荷载流子可视化工具对于有机薄膜中载流子传输的基础研究以及智能设计高效有机器件都至关重要。

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  • 来源
    《Advanced Materials》 |2014年第26期|4539-4545|共7页
  • 作者单位

    Department of Polymer Science and Engineering University of Massachusetts Amherst 120 Governors Amherst, MA 01003, USA;

    206 Kendade, Department of Physics Mount Holyoke College South Hadley, MA 01075, USA;

    206 Kendade, Department of Physics Mount Holyoke College South Hadley, MA 01075, USA;

    206 Kendade, Department of Physics Mount Holyoke College South Hadley, MA 01075, USA;

    Department of Polymer Science and Engineering University of Massachusetts Amherst 120 Governors Amherst, MA 01003, USA;

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