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Decoupling Photocurrent Loss Mechanisms in Photovoltaic Cells Using Complementary Measurements of Exciton Diffusion

机译:利用激子扩散的互补测量来解耦光伏电池中的光电流损耗机理

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Significant work has been directed at measuring the exciton diffusion length (L-D) in organic semiconductors due to its significance in determining the performance of photovoltaic cells. Several techniques have been developed to measure L-D, often probing photoluminescence or charge carrier generation. Interestingly, in this study it is shown that when different techniques are compared, both the diffusive behavior of the exciton and active carrier recombination loss pathways can be decoupled. Here, a planar heterojunction device based on the donor-acceptor pairing of boron subphthalocyanine chloride-C-60 is examined using photoluminescence quenching, photovoltage-, and photocurrent-based L-D measurement techniques. Photovoltage yields the device relevant L-D of both active materials as a function of forward bias subject to geminate recombination losses. These values are used to accurately predict the photocurrent as a function of voltage, suggesting geminate recombination is the dominant mechanism responsible for photocurrent loss. By combining these measurements with photocurrent and photoluminescence quenching, the intrinsic L-D, as well as the voltage-dependent charge transfer state dissociation and charge collection efficiencies are quantitatively determined. The results of this work provide a method to decouple all relevant loss pathways during photoconversion, and establish the factors that can limit the performance of excitonic photovoltaic cells.
机译:由于其在确定光伏电池性能方面的重要性,因此针对测量有机半导体中的激子扩散长度(L-D)进行了大量工作。已经开发了几种测量L-D的技术,通常用于探测光致发光或电荷载流子的产生。有趣的是,在这项研究中表明,当比较不同的技术时,激子的扩散行为和活性载体重组损失途径都可以解耦。在这里,使用光致发光猝灭,基于光电压和基于光电流的L-D测量技术来检查基于氯化亚酞菁硼-C-60的供体-受体配对的平面异质结器件。光电压产生两种活性物质的器件相关的L-D,这是正向偏压的函数,该正向偏压会发生双键重组损失。这些值被用来准确地预测光电流作为电压的函数,这表明ge子重组是造成光电流损失的主要机制。通过将这些测量与光电流猝灭和光致发光猝灭相结合,可以定量确定本征L-D以及与电压相关的电荷转移状态解离和电荷收集效率。这项工作的结果提供了一种在光转换过程中解耦所有相关损耗路径的方法,并建立了可以限制激子光伏电池性能的因素。

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