Accuracy of surface strain measurements from transmission electron microscopy images of nanoparticles

摘要

Strain analysis from high-resolution transmission electron microscopy (HRTEM) images offers a convenient tool for measuring strain in materials at the atomic scale. In this paper we present a theoretical study of the precision and accuracy of surface strain measurements directly from aberration-corrected HRTEM images. We examine the influence of defocus, crystal tilt and noise, and find that absolute errors of at least 1–2% strain should be expected. The model structures include surface relaxations determined using molecular dynamics, and we show that this is important for correctly evaluating the errors introduced by image aberrations.Electronic supplementary materialThe online version of this article (doi:10.1186/s40679-017-0047-0) contains supplementary material, which is available to authorized users.