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Investigations on the Mechanical Properties of Conducting Polymer Coating-Substrate Structures and Their Influencing Factors

机译:导电聚合物涂层-基底结构的力学性能及其影响因素的研究

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摘要

This review covers recent advances and work on the microstructure features, mechanical properties and cracking processes of conducting polymer film/coating- substrate structures under different testing conditions. An attempt is made to characterize and quantify the relationships between mechanical properties and microstructure features. In addition, the film cracking mechanism on the micro scale and some influencing factors that play a significant role in the service of the film-substrate structure are presented. These investigations cover the conducting polymer film/coating nucleation process, microstructure-fracture characterization, translation of brittle-ductile fractures, and cracking processes near the largest inherent macromolecule defects under thermal-mechanical loadings, and were carried out using in situ scanning electron microscopy (SEM) observations, as a novel method for evaluation of interface strength and critical failure stress.
机译:这篇综述涵盖了在不同测试条件下导电聚合物膜/涂层-基材结构的微观结构特征,机械性能和破裂过程的最新进展和工作。试图表征和量化机械性能和微观结构特征之间的关系。此外,提出了微观尺度上的薄膜开裂机理以及一些在薄膜-基底结构的服务中起重要作用的影响因素。这些研究涵盖了在热机械载荷作用下最大的固有高分子缺陷附近的导电聚合物薄膜/涂层成核过程,微观结构-断裂表征,脆性-韧性断裂的平移以及接近最大固有大分子缺陷的开裂过程,并且使用原位扫描电子显微镜进行了研究( SEM)观察,作为评估界面强度和临界破坏应力的一种新方法。

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