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Direct quantification of topological protection in symmetry-protected photonic edge states at telecom wavelengths

机译:在电信波长下对称保护光子边缘状态的直接量化拓扑保护

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摘要

a SEM of the fabricated structure with two pseudo-colored regions depicting the two lattices VPC1 and VPC2 with opposite valley-Chern invariants. The unit cell with lattice constant a = 503 nm consists of equilateral triangular holes of side lengths d1 = 0.7a and d2 = 0.45a. Scale bar: 500 nm. b Schematic of the near-field scanning optical microscope used to map the in-plane field distribution of the topologically non-trivial PhC edge mode. To facilitate heterodyne-based phase detection, the input beam is split into two branches, labeled signal and reference. An aperture-based near-field probe collects part of the evanescent tail of the in-plane field components while scanning over the crystal at a height of 20 nm and couples the collected light to a single-mode optical fiber. Inset: SEM image of the probe. c Measured normalized amplitude of the in-plane field components at a laser excitation wavelength of λ = 1600 nm over the extent of 165 unit cells, with the scale bar corresponding to 5 μm. Light is launched from a feed waveguide at the left side of the crystal, with the direction indicated by the red arrow. Left inset: zoomed-in view of the detected field amplitude pattern along the domain wall. Right inset: zoomed-in view of the out-coupling flank of the access waveguide
机译:具有两个伪彩色区域的制造结构的SEM,描绘了两个晶格VPC1和VPC2,具有相对的谷挖掘不变。具有晶格常数A = 503nm的单元电池由侧长度D1 = 0.7a和d2 = 0.45a等平等三角形孔组成。秤栏:500 nm。近场扫描光学显微镜的B示意图用于映射拓扑非平凡PHC边缘模式的平面内场分布。为了促进基于外差的相位检测,输入光束被分成两个分支,标记信号和参考。基于光圈的近场探针在晶体上收集面内现场部件的渐逝尾的一部分,同时在20nm的高度上扫描晶体并将收集的光耦合到单模光纤。插图:探头的SEM图像。 C在165个单元电池的范围内测量激光激发波长在激光激发波长的面内现场分量的归一化幅度,比对应于5μm的刻度条。光从晶体左侧的饲料波导发射,方向由红色箭头指示。左侧插入:静电沿域壁的检测场幅度图案的视图。右侧插入:静电鉴于接入波导的外耦合侧面

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