首页> 美国卫生研究院文献>other >NIOSH Field Studies Team Assessment: Worker Exposure to Aerosolized Metal Oxide Nanoparticles in a Semiconductor Fabrication Facility
【2h】

NIOSH Field Studies Team Assessment: Worker Exposure to Aerosolized Metal Oxide Nanoparticles in a Semiconductor Fabrication Facility

机译:NIOSH现场研究小组评估:半导体制造厂中工人暴露于气溶胶​​化的金属氧化物纳米颗粒的情况

代理获取
本网站仅为用户提供外文OA文献查询和代理获取服务,本网站没有原文。下单后我们将采用程序或人工为您竭诚获取高质量的原文,但由于OA文献来源多样且变更频繁,仍可能出现获取不到、文献不完整或与标题不符等情况,如果获取不到我们将提供退款服务。请知悉。

摘要

The ubiquitous use of engineered nanomaterials – particulate materials measuring approximately 1–100 nanometers (nm) on their smallest axis, intentionally engineered to express novel properties – in semiconductor fabrication poses unique issues for protecting worker health and safety. Use of new substances or substances in a new form may present hazards that have yet to be characterized for their acute or chronic health effects. Uncharacterized or emerging occupational health hazards may exist when there is insufficient validated hazard data available to make a decision on potential hazard and risk to exposed workers under condition of use. To advance the knowledge of potential worker exposure to engineered nanomaterials, the National Institute for Occupational Safety and Health Nanotechnology Field Studies Team conducted an on-site field evaluation in collaboration with on-site researchers at a semiconductor research and development facility on April 18–21, 2011. The Nanomaterial Exposure Assessment Technique (2.0) was used to perform a complete exposure assessment. A combination of filter-based sampling and direct-reading instruments was used to identify, characterize, and quantify the potential for worker inhalation exposure to airborne alumina and amorphous silica nanoparticles associated with the chemical mechanical planarization wafer polishing process. Engineering controls and work practices were evaluated to characterize tasks that might contribute to potential exposures and to assess existing engineering controls. Metal oxide structures were identified in all sampling areas, as individual nanoparticles and agglomerates ranging in size from 60nm to >1,000nm, with varying structure morphology, from long and narrow to compact. Filter-based samples indicated very little aerosolized material in task areas or worker breathing zone. Direct-reading instrument data indicated increased particle counts relative to background in the wastewater treatment area; however, particle counts were very low overall, indicating a well-controlled working environment. Recommendations for employees handling or potentially exposed to engineered nanomaterials include hazard communication, standard operating procedures, conservative ventilation systems, and prevention through design in locations where engineered nanomaterials are used or stored, and routine air sampling for occupational exposure assessment and analysis.
机译:工程纳米材料的无处不在使用-在半导体制造中有意地设计以表达新颖特性的,在其最小轴上尺寸约为1–100纳米(nm)的颗粒材料–为保护工人的健康和安全提出了独特的问题。使用新物质或新形式的物质可能会导致危害,尚未明确其急性或慢性健康影响。当没有足够的经过验证的危险数据来决定使用条件下暴露工人的潜在危害和风险时,可能会存在特征不明或正在出现的职业健康危害。为了提高对工人可能接触工程纳米材料的认识,美国国家职业安全与健康研究所纳米技术现场研究小组与现场研究人员合作,于4月18日至21日在半导体研究与开发机构进行了现场评估。 ,2011年。使用纳米材料暴露评估技术(2.0)进行了完整的暴露评估。基于过滤器的采样和直读仪器的组合用于识别,表征和量化工人吸入与化学机械平面化晶圆抛光工艺相关的空气中氧化铝和无定形二氧化硅纳米粒子的可能性。对工程控制和工作实践进行了评估,以表征可能导致潜在风险的任务并评估现有工程控制。在所有采样区域中都可以识别出金属氧化物结构,即单个纳米颗粒和团聚物的大小从60nm到> 1,000nm不等,结构形态从长到窄到紧凑。基于过滤器的样品表明任务区域或工人呼吸区域中的雾化物质很少。直读仪器数据表明,废水处理区的颗粒数相对于本底增加;但是,颗粒总数总体上非常低,这表明工作环境得到了良好控制。对于处理或可能暴露于工程纳米材料的员工的建议包括:危险通报,标准操作程序,保守的通风系统,以及通过在使用或储存工程纳米材料的位置进行设计预防的方法,以及用于职业暴露评估和分析的常规空气采样。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
代理获取

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号