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Qualitative and Quantitative Characterization of Composition Heterogeneity on the Surface of Spray Dried Amorphous Solid Dispersion Particles by an Advanced Surface Analysis Platform with High Surface Sensitivity and Superior Spatial Resolution

机译:利用具有高表面灵敏度和出色空间分辨率的先进表面分析平台对喷雾干燥的非晶态固体分散体颗粒表面的组成异质性进行定性和定量表征

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摘要

Surface composition critically impacts stability (e.g., crystallization) and performance (e.g., dissolution) of spray dried amorphous solid dispersion (ASD) formulations; however, traditional characterization techniques such as Raman and infrared spectroscopies may not provide useful information on surface composition on the spray dried ASD particles due to low spatial resolution, high probing depth, and lack of quantitative information. This study presents an advanced surface characterization platform consisting of two complementary techniques: X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS). Such a platform enables qualitative and quantitative measurements of surface composition for the fine spray dried ASD particles with ultrasurface-sensitivity (less than 10 nm from the surface) and superior spatial resolution (approximately 250 nm for ToF-SIMS). Both XPS and ToF-SIMS demonstrated that the polymer (PVPVA) was dominantly enriched on the surface of our spray dried naproxen-PVPVA ASD particles. Of a particular note was that XPS could differentiate two batches of spray dried ASD particles with a subtle difference in surface composition produced by varying feed solution solvents. This advanced surface characterization platform will provide essential surface information to understand the mechanisms underlying the impact of surface composition on stability (e.g., crystallization) and functionality (e.g., dissolution) in future studies.
机译:表面成分严重影响喷雾干燥的无定形固体分散体(ASD)制剂的稳定性(例如结晶)和性能(例如溶解);但是,由于空间分辨率低,探测深度高和缺乏定量信息,传统的表征技术(如拉曼光谱和红外光谱法)可能无法提供有关喷雾干燥的ASD颗粒表面成分的有用信息。这项研究提出了一个先进的表面表征平台,该平台包含两种互补技术:X射线光电子能谱(XPS)和飞行时间二次离子质谱(ToF-SIMS)。这种平台可以对具有超表面敏感性(距表面小于10 nm)和出色的空间分辨率(ToF-SIMS约为250 nm)的精细喷雾干燥ASD颗粒进行表面成分的定性和定量测量。 XPS和ToF-SIMS均表明,该聚合物(PVPVA)主要富集在我们喷雾干燥的萘普生-PVPVA ASD颗粒表面。特别值得注意的是,XPS可以区分两批喷雾干燥的ASD颗粒,它们的表面组成因进料溶液溶剂的变化而略有差异。这个先进的表面表征平台将提供重要的表面信息,以了解在未来的研究中表面组成对稳定性(例如,结晶化)和功能性(例如,溶解)的影响的潜在机制。

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