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Transmission Electron Microscopy as a Tool for the Characterization of Soft Materials: Application and Interpretation

机译:透射电子显微镜作为表征软材料的工具:应用和解释

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摘要

Transmission electron microscopy (TEM) provides direct structural information on nano‐structured materials and is popular as a characterization tool in soft matter and supramolecular chemistry. However, technical aspects of sample preparation are overlooked and erroneous image interpretations are regularly encountered in the literature. There are three most commonly used TEM methods as we derived from literature: drying, staining and cryo‐TEM, which are explained here with respect to their application, limitations and interpretation. Since soft matter chemistry relies on a lot of indirect evidence, the role of TEM for the correct evaluation of the nature of an assembly is very large. Mistakes in application and interpretation can therefore have enormous impact on the quality of present and future studies. We provide helpful background information of these three techniques, the information that can and cannot be derived from them and provide assistance in selecting the right technique for soft matter imaging. This essay warns against the use of drying and explains why. In general cryo‐TEM is by far the best suited method and many mistakes and over‐interpretations can be avoided by the use of this technique.
机译:透射电子显微镜(TEM)可提供有关纳米结构材料的直接结构信息,并已广泛用作软物质和超分子化学的表征工具。然而,样品制备的技术方面被忽视,并且在文献中经常遇到错误的图像解释。我们从文献中得出了三种最常用的TEM方法:干燥,染色和冷冻TEM,在此对它们的应用,局限性和解释进行了说明。由于软物质化学依赖于许多间接证据,因此TEM在正确评估装配体性质方面的作用非常大。因此,在应用和解释方面的错误可能会对当前和将来的研究质量产生巨大影响。我们提供了这三种技术的有用的背景信息,可以从中得出或不能从中得出的信息,并为选择正确的软物质成像技术提供了帮助。这篇文章警告不要使用干燥,并解释原因。通常,到目前为止,cryo-TEM是最合适的方法,使用此技术可以避免很多错误和过度解释。

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