首页> 美国卫生研究院文献>Nanoscale Research Letters >Measurements of Defect Structures by Positron Annihilation Lifetime Spectroscopy of the Tellurite Glass 70TeO2-5XO-10P2O5-10ZnO-5PbF2 (X = Mg Bi2 Ti) Doped with Ions of the Rare Earth Element Er3+
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Measurements of Defect Structures by Positron Annihilation Lifetime Spectroscopy of the Tellurite Glass 70TeO2-5XO-10P2O5-10ZnO-5PbF2 (X = Mg Bi2 Ti) Doped with Ions of the Rare Earth Element Er3+

机译:掺有稀土元素Er3 +的碲化物玻璃70TeO2-5XO-10P2O5-10ZnO-5PbF2(X = MgBi2Ti)的正电子ni没寿命光谱法测量缺陷结构

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摘要

The objective of the study was the structural analysis of the 70TeO2-5XO-10P2O5-10ZnO-5PbF2 (X = Mg, Bi2, Ti) tellurite glasses doped with ions of the rare-earth elements Er3+, based on the PALS (positron annihilation lifetime spectroscopy) method of measuring positron lifetimes. Values of positron lifetimes and the corresponding intensities may be connected with the sizes and number of structural defects, the sizes of which range from a few angstroms to a few dozen nanometers. Experimental positron lifetime spectrum revealed existence of two positron lifetime components τ 1 andτ 2. Their interpretation was based on two-state positron trapping model where the physical parameters are the positron annihilation rate and positron trapping rate.
机译:研究的目的是对掺有稀土元素Er 3 + 离子的70TeO2-5XO-10P2O5-10ZnO-5PbF2(X = Mg,Bi2,Ti)碲酸盐玻璃进行结构分析,基于测量正电子寿命的PALS(正电子an灭寿命光谱)方法。正电子寿命的值和相应的强度可能与结构缺陷的大小和数量有关,结构缺陷的大小范围从几埃到几十纳米。实验性正电子寿命谱揭示了两个正电子寿命分量τ1和τ2的存在。它们的解释基于两种状态的正电子俘获模型,其中物理参数是正电子an灭率和正电子俘获率。

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